UMAKOSHI(C02), GANSER(A01), SAGARA(A03), YAGAI(A01) et al. have published their research about development of tip-scan high-speed AFM compatible with organic solvents in Langmuir.

Tip-Scan High-Speed Atomic Force Microscopy in Organic Solvent: A Versatile Tool for Visualizing Dynamic Behaviors of Soft-Materials

H. Matsui, C. Ganser, K. Tamaki, Q. Liu, F.-Y. Chan, T. Uchihashi, P. Verma, Y. Sagara, S. Yagai, T. Umakoshi

DOI:10.1021/acs.langmuir.5c04454